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Volumn 715, Issue , 2002, Pages 565-570
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Protocrystalline Si:H p-type layers for maximization of the open circuit voltage in a-Si:H n-i-p solar cells
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
CRYSTALLINE MATERIALS;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC POTENTIAL;
ELLIPSOMETRY;
PHASE TRANSITIONS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SPECTROSCOPIC ANALYSIS;
OPEN CIRCUIT VOLTAGE;
PHOTOCRYSTALLINE LAYERS;
SPECTROSCOPIC ELLIPSOMETRY;
THICKNESS DEPENDENT TRANSITION;
SILICON SOLAR CELLS;
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EID: 0036920087
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-715-a6.1 Document Type: Conference Paper |
Times cited : (4)
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References (10)
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