Automatic classification of noise for infrared images into processes by means of the principal component analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4719, Issue , 2002, Pages 95-106

  López Alonso, José Manuel ^a   Alda, Javier ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; COMPUTER SIMULATION; COMPUTER SOFTWARE; EIGENVALUES AND EIGENFUNCTIONS; FOURIER TRANSFORMS; IMAGE ANALYSIS; IMAGING SYSTEMS; MATRIX ALGEBRA; PRINCIPAL COMPONENT ANALYSIS; WHITE NOISE;

EIGENIMAGES; FIXED PATTERN NOISE; FOCAL PLANE ARRAYS; INFRARED CAMERAS; NOISE CHARACTERIZATION; NOISE CLASSIFICATION;

INFRARED IMAGING;

EID: 0036912738     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.477455     Document Type: Conference Paper

References (13)

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