Transient photocurrents in microcrystalline silicon films

Materials Research Society Symposium - Proceedings

Volumn 715, Issue , 2002, Pages 345-350

  Reynolds, Steve ^a   Smirnov, Vladimir ^a   Main, Charlie ^a   Carius, Reinhard ^b   Finger, Friedhelm ^b  

^a UNIVERSITY OF ABERTAY DUNDEE   (United Kingdom)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; ELECTRONIC DENSITY OF STATES; LASER PULSES; PHASE TRANSITIONS; PHOTOCONDUCTIVITY; PHOTOCURRENTS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REACTION KINETICS; SPECTROSCOPIC ANALYSIS; THERMAL EFFECTS;

DENSITY OF STATES SPECTROSCOPY; MICROCRYSTALLINE SILICON FILMS; TRANSIENT PHOTOCONDUCTIVITY; TRANSIENT PHOTOCURRENTS;

SILICON;

EID: 0036909582     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-715-a21.2     Document Type: Conference Paper

References (8)

1. F. Finger, O. Vetterl, R. Carius, A. Lambertz, C. Scholten, L. Houben and M. Luysberg, in Materials for Information Technology in the New Millennium, edited by J.M. Marshall, A.G. Petrov, A. Vavrek, D. Nesheva, D. Dimova-Malinovska and J.M. Maud (Published by the Editors, 2001), pp 26-33.
2. N. Wyrsch, L. Feitnecht, C. Droz, P. Torres, A. Shah, A. Poruba and M. Vanecek, J. Non-Cryst. Solids 266-269, 1099 (2000).
3. C. Main, in Properties of Amorphous Silicon and its Alloys, ed. T. Searle (IEE, 1998), p227.
4. R. Brüggemann, J.P. Kleider, C. Longeaud, D. Mencaraglia, J. Guillet, J.E. Bourée and C. Niikura, J. Non-Cryst. Solids, 266-269, 258 (2000).
5. J.P. Kleider, C. Longeaud, R. Brüggemann and F. Houzé, Thin Solid Films 383, 57 (2001).
6. A.L. Baia Neto, A. Lambertz, R. Carius and F. Finger, Phys. Stat. Sol. (a) 186, R4-R6 (2001).
7. S. Reynolds, C. Main, D.P. Webb and M.J. Rose, Phil. Mag. B 80, 547 (2000).
8. C. Main, R. Russell, J. Berkin and J.M. Marshall, Phil. Mag. Lett. 55, 189 (1987).