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Volumn 197, Issue 3-4, 2002, Pages 265-270
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Damage of alumina films by medium energy hydrogen and helium ions
d
KEIO UNIVERSITY
(Japan)
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Author keywords
Aluminium; Beam damage; Films; Helium; Hydrogen; Oxide
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Indexed keywords
ALUMINA;
CONDENSATION;
INTERFACES (MATERIALS);
IRRADIATION;
SCANNING ELECTRON MICROSCOPY;
SURFACE PHENOMENA;
TRANSMISSION ELECTRON MICROSCOPY;
SURFACE DAMAGES;
POSITIVE IONS;
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EID: 0036896465
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01486-6 Document Type: Article |
Times cited : (4)
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References (15)
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