Open contact analysis of single bit failure in 0.18 μm technology

Microelectronics Reliability

Volumn 42, Issue 12, 2002, Pages 1997-2001

  Song, Zhigang ^a   Dai, Jiyan ^b   Redkar, Shailesh ^a  

^a CHARTERED SEMICONDUCTOR MANUFACTURING LTD   (Singapore)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; DEFECTS; ELECTRIC POTENTIAL; FAILURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

SINGLE BIT FAILURE;

STATIC RANDOM ACCESS STORAGE;

EID: 0036890951     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00117-8     Document Type: Article

References (6)

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