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Volumn 17, Issue 6, 2002, Pages 1067-1072

The p- layer punch-through structure with a thick, high concentration p emitter for a light-triggered thyristor

Author keywords

Photo thyristors; Power semiconductor devices; Thyristors

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; COMPUTER SIMULATION; ELECTRIC FIELDS; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRIC RESISTANCE; ELECTRIC WAVEFORMS; INSULATED GATE BIPOLAR TRANSISTORS; LEAKAGE CURRENTS; POWER ELECTRONICS; SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0036875657     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2002.805596     Document Type: Article
Times cited : (2)

References (14)
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  • 6
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    • Temple, V.A.K.1    Holroyed, F.W.2
  • 8
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    • Aldrich, R.W.1    Holonyak N., Jr.2
  • 10
    • 0030170053 scopus 로고    scopus 로고
    • An overvoltage self-protected thyristor with a structure to predict breakover voltage
    • June
    • Y. Shimizu, H. Kozaka, S. Murakami, and M. Takata, "An overvoltage self-protected thyristor with a structure to predict breakover voltage," IEEE Trans. Electron Devices, vol. 43, pp. 1000-1006, June 1996.
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    • Shimizu, Y.1    Kozaka, H.2    Murakami, S.3    Takata, M.4
  • 11
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    • Asymmetric thyristors for switching frequencies above 20kHz
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    • (1986)
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  • 12
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    • One-dimensional analysis of turn off phenomena for a gate turn off thyristor
    • Mar.
    • M. Naito et al., "One-dimensional analysis of turn off phenomena for a gate turn off thyristor," IEEE Trans. Electron Devices, vol. 26, Mar. 1979.
    • (1979) IEEE Trans. Electron Devices , vol.26
    • Naito, M.1
  • 13
    • 0018996595 scopus 로고
    • One-dimensional analysis of reverse recovery and dv/dt triggering characteristics for a thyristor
    • Mar.
    • H. Fukui et al., "One-dimensional analysis of reverse recovery and dv/dt triggering characteristics for a thyristor," IEEE Trans. Electron Devices, vol. 27, Mar. 1980.
    • (1980) IEEE Trans. Electron Devices , vol.27
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  • 14
    • 0016079570 scopus 로고
    • A thyristor protected against di/dt failure at breakdown turn-on
    • P. Voss, "A thyristor protected against di/dt failure at breakdown turn-on," Solid State Electron., vol. 17, pp. 665-661, 1974.
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    • Voss, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.