Imagery of local defects in multilayer components by short coherence length interferometry

Optics Letters

Volumn 27, Issue 21, 2002, Pages 1899-1901

  Vabre, L ^a   Loriette, V ^a   Dubois, A ^a   Moreau, J ^a   Boccara, A C ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COHERENT LIGHT; DIELECTRIC MATERIALS; IMAGING TECHNIQUES; INTERFEROMETRY; LIGHT INTERFERENCE; LIGHT SCATTERING; MICROSCOPES; OPTICAL DEVICES; POINT DEFECTS; THIN FILMS;

LASER MIRRORS;

OPTICAL MULTILAYERS;

EID: 0036867817     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.27.001899     Document Type: Article

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