Thermal conductivity of AlN ceramic with a very low amount of grain boundary phase at 4 to 1000 K

Journal of Materials Research

Volumn 17, Issue 11, 2002, Pages 2940-2944

  Watari, Koji ^a   Nakano, Hiromi ^b   Urabe, Kazuyori ^b   Ishizaki, Kozo ^c   Cao, Shixun ^d   Mori, Katsunori ^d  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b RYUKOKU UNIVERSITY   (Japan)

^c NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^d UNIVERSITY OF TOYAMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CERAMIC MATERIALS; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PHONONS; SCANNING ELECTRON MICROSCOPY; SCATTERING; SINGLE CRYSTALS; THERMAL CONDUCTIVITY; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

GRAIN JUNCTIONS; PHONON SCATTERING;

ALUMINUM NITRIDE;

EID: 0036867650     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2002.0426     Document Type: Article

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