Residual stresses in functionally graded plates

Journal of Materials Research

Volumn 17, Issue 11, 2002, Pages 2912-2920

  Neubrand, Achim ^a   Chung, Tai Joo ^a,d   Rödel, Jürgen ^a   Steffler, Eric D ^b   Fett, Theo ^c  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b IDAHO NATIONAL LABORATORY   (United States)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^d Andong National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; COMPOSITION; ELASTIC MODULI; FINITE ELEMENT METHOD; INTERFEROMETRY; NEUTRON DIFFRACTION; POISSON RATIO; POROSITY; RESIDUAL STRESSES; RESONANCE; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

FUNCTIONALLY GRADED PLATES; MOIRE INTERFEROMETRY; RESONANCE FREQUENCY; WEIGHT FUNCTION METHOD;

FUNCTIONALLY GRADED MATERIALS;

EID: 0036865492     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2002.0422     Document Type: Article

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