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Volumn 4, Issue 6, 2002, Pages

Modern optoelectronic methods for non-contact deformation measurement in industry

Author keywords

Electro optic holography; Interferometry; Non contact deformation measurement; Ray method; Wavefront reconstruction

Indexed keywords

AUTOMATION; COHERENT LIGHT; DEFORMATION; ELECTROOPTICAL EFFECTS; HOLOGRAPHY; INTERFEROMETRY; LIGHT REFLECTION; MECHANICAL VARIABLES MEASUREMENT; PHASE SHIFT; SIGNAL INTERFERENCE; SURFACE ROUGHNESS;

EID: 0036863708     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/4/6/389     Document Type: Article
Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.