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Volumn 4398, Issue , 2001, Pages 280-288

Application of multistep algorithms for deformation measurement

Author keywords

Interferometry; Non contact deformation measurement; Phase shifting algorithms

Indexed keywords

ALGORITHMS; CHARGE COUPLED DEVICES; DEFORMATION; ERROR ANALYSIS; INTERFEROMETRY; LIGHT INTERFERENCE; OPTICAL SENSORS; PHASE SHIFT;

EID: 0035758649     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.445563     Document Type: Conference Paper
Times cited : (8)

References (8)
  • 6
    • 0001418962 scopus 로고
    • Phase shifting interferometry
    • D.Malacara, Ed., John Wiley and Sons, New York
    • Grievenkamp J.E.,Bruning J.H.: Phase shifting interferometry, in Optical Shop Testing, D.Malacara, Ed., John Wiley and Sons, New York, 1992.
    • (1992) Optical Shop Testing
    • Grievenkamp, J.E.1    Bruning, J.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.