Model quality needs to be job one

IEEE Circuits and Devices Magazine

Volumn 18, Issue 6, 2002, Pages 29-35

  Liu, William ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC RESISTANCE; ERROR ANALYSIS; GATES (TRANSISTOR); LEAKAGE CURRENTS; QUALITY ASSURANCE; SPURIOUS SIGNAL NOISE; SUBSTRATES; THRESHOLD VOLTAGE;

TUNNELING CURRENTS;

MOSFET DEVICES;

EID: 0036863020     PISSN: 87553996     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCD.2002.1175758     Document Type: Article

References (3)

1. http://www-device.eecs.berkeley.edu/̃bsim3/.
2. http://www.semiconductors.philips.com/Philips_Models/documentatin.
3. W. Liu, MOSFET Models for SPICE Simulation, Including BSIM3v3 an BSIM4. New York: Wiley, 2001.