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Volumn 33, Issue 11, 2002, Pages 995-998

Silicon effect on GaN surface morphology

Author keywords

Metalorganic vapor phase epitaxy; Morphology; Reflectometry; Si doped GaN

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT EMITTING DIODES; METALLORGANIC VAPOR PHASE EPITAXY; PARTIAL PRESSURE; REFLECTOMETERS; SEMICONDUCTING SILICON;

EID: 0036856599     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(02)00066-6     Document Type: Conference Paper
Times cited : (16)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.