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Volumn 33, Issue 11, 2002, Pages 995-998
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Silicon effect on GaN surface morphology
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Author keywords
Metalorganic vapor phase epitaxy; Morphology; Reflectometry; Si doped GaN
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
LIGHT EMITTING DIODES;
METALLORGANIC VAPOR PHASE EPITAXY;
PARTIAL PRESSURE;
REFLECTOMETERS;
SEMICONDUCTING SILICON;
LASER REFLECTOMETRY;
GALLIUM NITRIDE;
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EID: 0036856599
PISSN: 00262692
EISSN: None
Source Type: Journal
DOI: 10.1016/S0026-2692(02)00066-6 Document Type: Conference Paper |
Times cited : (16)
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References (13)
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