Study of the isotropic contribution to the analysis of photoelectron diffraction experiments at the ALOISA beamline

Journal of Electron Spectroscopy and Related Phenomena

Volumn 127, Issue 1-2, 2002, Pages 85-92

  Bruno, F ^a   Floreano, L ^a   Verdini, A ^a   Cvetko, D ^a,b,c   Gotter, R ^a   Morgante, A ^a,d   Canepa, M ^e   Terreni, S ^e  

^a INFM   (Italy)

^b UNIVERSITY OF LJUBLJANA   (Slovenia)

^c SINCROTRONE TRIESTE   (Italy)

^d UNIVERSITY OF TRIESTE   (Italy)

^e UNIVERSITY OF GENOA   (Italy)

Author keywords

Angular resolved photoemission; Photoelectron diffraction; Thin films

Indexed keywords

LATTICE CONSTANTS; PHOTOEMISSION; SCATTERING; SURFACE ROUGHNESS; THIN FILMS;

PHOTOELECTRON DIFFRACTION;

ELECTRON DIFFRACTION;

EID: 0036841788     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(02)00176-7     Document Type: Article

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