CMOS open defect detection by supply current measurement under time-variable electric field supply

IEICE Transactions on Information and Systems

Volumn E85-D, Issue 10, 2002, Pages 1542-1550

  Hashizume, Masaki ^a   Ichimiya, Masahiro ^a   Yotsuyanagi, Hiroyuki ^a   Tamesada, Takeomi ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

CMOS; Electric field; Open defect; Supply current test

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; LOGIC CIRCUITS; VECTORS;

SUPPLY CURRENT TESTS;

CMOS INTEGRATED CIRCUITS;

EID: 0036825554     PISSN: 09168532     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (7)

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