메뉴 건너뛰기




Volumn 47, Issue 10, 2002, Pages 1333-1336

Diffusion of as ions and self-diffusion in silicon during implantation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0036805049     PISSN: 10637842     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1514818     Document Type: Article
Times cited : (1)

References (12)
  • 4
    • 0011169502 scopus 로고    scopus 로고
    • private communication
    • K.D. Demakov, private communication.
    • Demakov, K.D.1
  • 11
    • 0011208371 scopus 로고    scopus 로고
    • private communication
    • E.K. Baranova, private communication.
    • Baranova, E.K.1
  • 12
    • 0011175466 scopus 로고    scopus 로고
    • Tech. Phys. 46, 490 (2001)
    • K.D. Demakov and V.A. Starostin, Zh. Tekh. Fiz. 71 (4), 128 (2001) [Tech. Phys. 46, 490 (2001)].
    • (2001) Zh. Tekh. Fiz. , vol.71 , Issue.4 , pp. 128
    • Demakov, K.D.1    Starostin, V.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.