A novel technique for measuring diffusivities of short-lived radioisotopes in solids

Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 93, Issue 10, 2002, Pages 1077-1082

  Voss, Thilo ^a   Strohm, Andreas ^a   Matics, Stefan ^a   Scharwaechter, Peter ^a   Frank, Werner ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Diffusion of 31Si and 11C in Si Ge and Si0.29B0.09C0.41N0.21; Diffusivities in solids measured by radiotracer techniques; Novel set up for short lived radiotracer atoms

Indexed keywords

CERAMIC MATERIALS; DIFFUSION IN SOLIDS; RADIOACTIVE TRACERS; SILICON ALLOYS;

DIFFUSIVITY MEASUREMENT; SHORT LIVED RADIOISOTOPES;

RADIOISOTOPES;

EID: 0036804758     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.021077     Document Type: Article

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