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Volumn 8, Issue 4, 1998, Pages 338-342

Mechanical lapping, handling and transfer of ultra-thin wafers

Author keywords

[No Author keywords available]

Indexed keywords

LAPPING; MATERIALS HANDLING; MOSFET DEVICES; MULTICHIP MODULES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON WAFERS; SUBSTRATES; ULTRATHIN FILMS;

EID: 0032295626     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/8/4/013     Document Type: Article
Times cited : (16)

References (8)
  • 1
    • 0005256236 scopus 로고
    • The 3D-interconnect. Application for mass memories and microprocessors
    • Val C 1991 The 3D-interconnect. Application for mass memories and microprocessors Proc. ISHM Conf. pp 62-8
    • (1991) Proc. ISHM Conf. , pp. 62-68
    • Val, C.1
  • 2
    • 1542650657 scopus 로고
    • An ultra high density technology for microsystems
    • Larcombe S and Ivey P 1991 An ultra high density technology for microsystems Microelectron. Int. 41 15-8
    • (1991) Microelectron. Int. , vol.41 , pp. 15-18
    • Larcombe, S.1    Ivey, P.2
  • 4
    • 0029755547 scopus 로고    scopus 로고
    • Design and fabrication of a miniature pressure sensor head using direct bonded ultra-thin silicon wafers
    • Statter C, Olson E and Farmer K 1996 Design and fabrication of a miniature pressure sensor head using direct bonded ultra-thin silicon wafers IEEE 239-43
    • (1996) IEEE , pp. 239-243
    • Statter, C.1    Olson, E.2    Farmer, K.3
  • 7
    • 0031222635 scopus 로고    scopus 로고
    • Substrate bonding techniques for CMOS processed wafers
    • Van Der Groen S 1997 Substrate bonding techniques for CMOS processed wafers J. Micromech. Microeng. 7 108-10
    • (1997) J. Micromech. Microeng. , vol.7 , pp. 108-110
    • Van Der Groen, S.1
  • 8
    • 0030081591 scopus 로고    scopus 로고
    • Micro-Raman spectroscopy to study local mechanical stress in silicon integrated circuits
    • de Wolf I 1996 Micro-Raman spectroscopy to study local mechanical stress in silicon integrated circuits Semicond. Sci. Technol. 139-54
    • (1996) Semicond. Sci. Technol. , pp. 139-154
    • De Wolf, I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.