The effect of UV irradiation on antimony-doped tin dioxide thin films derived from methacrylic acid modified precursors

Chemistry of Materials

Volumn 14, Issue 10, 2002, Pages 4443-4447

  Kololuoma, T ^a   Johansson, L S ^b   Campbell, J M ^b   Tolonen, A ^c   Halttunen, M ^a   Haatainen, T ^a   Rantala, J T ^d  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

^b AALTO UNIVERSITY   (Finland)

^c UNIVERSITY OF OULU   (Finland)

^d GuideOptics Oy   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; METHACRYLIC ACID; TIN DERIVATIVE;

ARTICLE; CHEMICAL COMPOSITION; CHEMICAL MODIFICATION; CRYSTAL STRUCTURE; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; FILM; SEMICONDUCTOR; SURFACE PROPERTY; TEMPERATURE DEPENDENCE; ULTRAVIOLET IRRADIATION;

EID: 0036800289     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm021228j     Document Type: Article

References (17)

1. Rantala, J. T.; Äyräs, P.; Levy, R.; Honkanen, S.; Descour, M. R.; Peyghambarian, N. Opt. Lett. 1998, 23, 1939.
2. Tadanaga, K.; Owan, T.; Morinaga, J.; Urbanek, S.; Minami, T. J. Sol-Gel Sci. Technol. 2000, 19, 791.
3. Kololuoma, T.; Kärkkäinen, A. H. O.; Rantala, J. T. Thin Solid Films 2002, 408, 128.
4. Chatelon, J. P.; Terrier, C.; Roger, J. A. J. Sol-Gel Sci. Technol. 1997, 10, 55.
5. Kololuoma, T.; Rantala, J. T. Electron. Lett. 2000, 26, 172.
6. Takahashi, Y.; Wada, Y. J. Electrochem. Soc. 1990, 137, 267.
7. Aegerter, M. A.; Reich, A.; Ganz, D.; Gasparro, G.; Pütz, J.; Krajewski, T. J. Non-Crys. Solids 1997, 218, 123.
8. Park, S.-S.; Mackenzie, J. D. Thin Solid Films 1995, 258, 268, and references therein.
9. Lambert, C. M. Sol. Energy Mater. 1981, 6, 1.
10. Kohl, D. Sens. Actuators 1989, 18, 71.
11. Tamai, T.; Ichinose, N.; Kawanishi, S.; Nishii, M.; Sasuga, T.; Hashida, I.; Mizuno, K. Chem. Mater. 1997, 9, 2674.
12. Koichi, K.; Kiichiro, S.; Katsuhiko, T.; Shinichi, H. J. Am. Ceram. Soc. 1999, 82, 2263.
13. Schuler, T.; Aegerter, M. A. Thin Solid Films 1999, 351, 125.
14. McIntyre, N. S.; Chan, T. C. In Practical Surface Analysis; Briggs, D., Seah, M. P., Eds.; Wiley: New York, 1990; p 498.
15. Topas P, Version 1.0; Bruker AXS: Karlsruhe, Germany, 1999.
16. Chastain, J.; King, R. C., Jr. Handbook of X-ray Photoelectron Spectroscopy; Perkin-Elmer Corporation: Eden Prairie, MN, 1995.
17. Terrier, C.; Chatelon, J. P.; Roger, J. A.; Berjoan, R.; Dubois, C. J. Sol-Gel Sci. Technol. 1997, 10, 75.