High-performance digital control system for scanning tunnelling microscopy

Measurement Science and Technology

Volumn 13, Issue 10, 2002, Pages 1599-1607

  Boudreau, Alex ^a   Paillard, Bruno ^a   Rowntree, Paul ^a  

^a UNIVERSITÉ DE SHERBROOKE   (Canada)

Author keywords

Capacitive coupling compensation; Digital control; DSP (Digital signal processing); Scanning tunnelling microscope

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRODES; IMAGE ANALYSIS; OPTIMIZATION; RISK ASSESSMENT; SCANNING TUNNELING MICROSCOPY;

ATOMIC RESOLUTION;

DIGITAL CONTROL SYSTEMS;

CONTROL SYSTEM; COST; INSTRUMENTATION; MICROSCOPY; PERFORMANCE;

EID: 0036798222     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/13/10/313     Document Type: Article

References (12)

1. Digital linearization and cancellation of capacitive coupling for scanning tunneling microscope
2. Control circuit for a scanning tunneling microscope
3. A digital control system for scanning microscopy and atomic force microscopy
4. Digital signal processor control of scanned probe microscopes
5. Analysis of scanning tunneling microscopy feedback system
6. Analysis of scanning tunneling microscopy feedback system: Experimental determination of parameter
7. Control system analysis of a scanning tunnelling microscope
8. An ultrahigh vacuum high speed scanning tunneling microscope
9. Molecularly resolved surface superstructures of self-assembled butanethiol monolayers on gold
10. Complex structural dynamics at adsorbed alkanethiol layers at Au(111) single-crystal domains