![]() |
Volumn 58, Issue 10 I, 2002, Pages 1820-1825
|
On the fitting of model electron densities into EM reconstructions: A reciprocal-space formulation
a
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ARTICLE;
CHEMICAL STRUCTURE;
CONFORMATION;
ELECTRON MICROSCOPY;
IMAGE PROCESSING;
METHODOLOGY;
SENSITIVITY AND SPECIFICITY;
IMAGE PROCESSING, COMPUTER-ASSISTED;
MICROSCOPY, ELECTRON;
MODELS, MOLECULAR;
MOLECULAR CONFORMATION;
SENSITIVITY AND SPECIFICITY;
|
EID: 0036795476
PISSN: 09074449
EISSN: None
Source Type: Journal
DOI: 10.1107/S0907444902013707 Document Type: Article |
Times cited : (114)
|
References (20)
|