Dual-wavelength interferometric technique with subnanometric resolution

Applied Optics

Volumn 41, Issue 28, 2002, Pages 5933-5937

  Chen, Benyong ^a   Cheng, Xiaohui ^a   Li, Dacheng ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036794124     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.005933     Document Type: Article

References (15)

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