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Volumn 517, Issue 1-3, 2002, Pages 1-7
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Chemical effects in the Auger spectrum of lead, deposited on nickel oxide - An indirect characterization of the NiO growth mode on Ni (1 0 0)
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Author keywords
Atom solid interactions; Auger electron spectroscopy; Growth; Lead; Low energy electron diffraction (LEED); Low index single crystal surfaces; Nickel; Nickel oxides; Oxidation; Oxygen
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Indexed keywords
ADSORPTION;
ANNEALING;
AUGER ELECTRON SPECTROSCOPY;
FILM GROWTH;
HYDROXYLATION;
LEAD;
LOW ENERGY ELECTRON DIFFRACTION;
MONOLAYERS;
NICKEL COMPOUNDS;
NUCLEATION;
OXIDATION;
SINGLE CRYSTALS;
CHEMICAL EFFECTS;
DEPOSITION;
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EID: 0036784061
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)02082-4 Document Type: Article |
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Times cited : (4)
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References (35)
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