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Volumn 398, Issue 1-2, 1998, Pages 221-230

Growth and structure of lead overlayers on nickel (100) Thermal stability of the adlayer

(1)  Argile, C a  

a CNRS   (France)

Author keywords

Auger electron spectroscopy; Growth; Lead; Low energy electron diffraction; Low index single crystal surfaces; Metallic films; Nickel; Thermal desorption

Indexed keywords

ADSORPTION; AUGER ELECTRON SPECTROSCOPY; CRYSTAL ORIENTATION; DESORPTION; FILM GROWTH; LEAD; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; PALLADIUM; REACTION KINETICS; SINGLE CRYSTALS; THERMODYNAMIC STABILITY;

EID: 0032003238     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)80026-5     Document Type: Article
Times cited : (8)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.