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Volumn 517, Issue 1-3, 2002, Pages 157-176
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Contact angle dependence of solid probe-liquid drop forces in AFM measurements
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Author keywords
Atomic force microscopy; Curved surfaces; Solid liquid interfaces; Surface tension
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BOUNDARY CONDITIONS;
CONTACT ANGLE;
DROP FORMATION;
PERTURBATION TECHNIQUES;
SURFACE TENSION;
SOLID-LIQUID INTERFACES;
CONTACTS (FLUID MECHANICS);
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EID: 0036783910
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)02054-X Document Type: Article |
Times cited : (28)
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References (21)
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