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Volumn 49, Issue 10, 2002, Pages 1839-1841

Comment on "modeling of small-signal minority-carrier transport in bipolar devices at arbitrary injection levels"

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BIPOLAR TRANSISTORS; COMPUTER SIMULATION; ELECTRIC ADMITTANCE; ELECTRON TRANSPORT PROPERTIES; MATHEMATICAL MODELS; NUMERICAL ANALYSIS;

EID: 0036772941     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.802138     Document Type: Note
Times cited : (2)

References (9)
  • 1
    • 0023591468 scopus 로고
    • An accurate bipolar model for large signal transient and ac applications
    • J. Seitchik, A. Chatterjee, and P. Yang, "An accurate bipolar model for large signal transient and ac applications," in IEDM Tech. Dig., 1987, pp. 244-247.
    • (1987) IEDM Tech. Dig. , pp. 244-247
    • Seitchik, J.1    Chatterjee, A.2    Yang, P.3
  • 3
    • 0028746159 scopus 로고    scopus 로고
    • A quasistatic approach for modeling the influence of emitter stored charge on the high frequency small signal ac response of bipolar transistors
    • J. Hamel, "A quasistatic approach for modeling the influence of emitter stored charge on the high frequency small signal ac response of bipolar transistors," in Proc. IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Minneapolis, MN, Oct. 1994, pp. 44-47.
    • Proc. IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Minneapolis, MN, Oct. 1994 , pp. 44-47
    • Hamel, J.1
  • 4
    • 0029771857 scopus 로고    scopus 로고
    • Compact modeling of the influence of emitter stored charge on the high frequency small signal ac response of bipolar transistors using quasistatic parameters
    • Jan.
    • ____, "Compact modeling of the influence of emitter stored charge on the high frequency small signal ac response of bipolar transistors using quasistatic parameters," IEEE J. Solid-State Circuits, pp. 106-113, Jan. 1996.
    • (1996) IEEE J. Solid-State Circuits , pp. 106-113
    • Hamel, J.1
  • 5
    • 0030190702 scopus 로고    scopus 로고
    • An accurate charge control approach for modeling excess phase shift in the base region of bipolar transistors
    • July
    • ____, "An accurate charge control approach for modeling excess phase shift in the base region of bipolar transistors," IEEE Trans. Electron Devices, pp. 1092-1098, July 1996.
    • (1996) IEEE Trans. Electron Devices , pp. 1092-1098
    • Hamel, J.1
  • 6
    • 0032121926 scopus 로고    scopus 로고
    • Modeling of small-signal minority-carrier transport in bipolar devices at arbitrary injection levels
    • July
    • N. Rinaldi, "Modeling of small-signal minority-carrier transport in bipolar devices at arbitrary injection levels," IEEE Trans. Electron Devices, vol. 45, pp. 1501-1510, July 1998.
    • (1998) IEEE Trans. Electron Devices , vol.45 , pp. 1501-1510
    • Rinaldi, N.1
  • 7
    • 0024648176 scopus 로고
    • One-dimensional nonquasi-static models for arbitrarily and heavily doped quasineutral layers in bipolar transistors
    • Apr.
    • B. S. Wu and F. A. Lindholm, "One-dimensional nonquasi-static models for arbitrarily and heavily doped quasineutral layers in bipolar transistors," IEEE Trans. Electron Devices, vol. 36, pp. 727-737, Apr. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 727-737
    • Wu, B.S.1    Lindholm, F.A.2
  • 8
    • 0026172211 scopus 로고
    • The general transient charge control relation-a new charge control relation for semiconductor devices
    • June
    • J. Hamel and C. Selvakumar, "The general transient charge control relation-A New charge control relation for semiconductor devices," IEEE Trans. Electron Devices, vol. 38, pp. 1467-1476, June 1991.
    • (1991) IEEE Trans. Electron Devices , vol.38 , pp. 1467-1476
    • Hamel, J.1    Selvakumar, C.2
  • 9
    • 0032142551 scopus 로고    scopus 로고
    • Analysis and modeling of small-signal bipolar transistor operation at arbitrary injection levels
    • Aug.
    • N. Rinaldi, "Analysis and modeling of small-signal bipolar transistor operation at arbitrary injection levels," IEEE Trans. Electron Devices, vol. 45, pp. 1817-1825, Aug. 1998.
    • (1998) IEEE Trans. Electron Devices , vol.45 , pp. 1817-1825
    • Rinaldi, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.