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Volumn 20, Issue 3, 2002, Pages 441-444

Low energy electron attachment to formic acid

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LEVELS; ELECTRONS; MASS SPECTROMETRY; NEGATIVE IONS; PHOTODISSOCIATION;

EID: 0036769951     PISSN: 14346060     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjd/e2002-00140-1     Document Type: Article
Times cited : (37)

References (22)
  • 18
    • 33744810153 scopus 로고
    • Abstract of contributed papers, Brighton
    • M. Tronc, M. Allan, F. Edard, Abstract of contributed papers, XVth XV ICPEAC, Brighton, 1987, p. 335
    • (1987) XVth XV ICPEAC , pp. 335
    • Tronc, M.1    Allan, M.2    Edard, F.3
  • 20
    • 84870414017 scopus 로고    scopus 로고
    • NIST chemistry webbook
    • February, edited by W.G. Mallard, P.J. Linstrom, National Institute of Standards and Technology, Gaithersburg MD 20899
    • NIST Chemistry Webbook, NIST Standard Reference Database Number 69, February 2000, edited by W.G. Mallard, P.J. Linstrom, National Institute of Standards and Technology, Gaithersburg MD 20899 (http://webbook.nist.gov/)
    • (2000) NIST Standard Reference Database , vol.69


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.