|
Volumn 193, Issue 1, 2002, Pages 69-77
|
Influence of the oxygen partial pressure on the composition and optical properties of electron-beam evaporated TiOx films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
COMPOSITION EFFECTS;
DEPOSITION;
ELECTRON RESONANCE;
ELECTRON SCATTERING;
EVAPORATION;
LIGHT EXTINCTION;
OXYGEN;
PARTIAL PRESSURE;
REFRACTIVE INDEX;
SEMICONDUCTING FILMS;
DEPTH PROFILING;
ELECTRON BEAM EVAPORATION;
RESONANT ELASTIC SCATTERING;
TITANIUM OXIDES;
|
EID: 0036748772
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(200209)193:1<69::AID-PSSA69>3.0.CO;2-4 Document Type: Article |
Times cited : (3)
|
References (13)
|