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Volumn 193, Issue 1, 2002, Pages 69-77

Influence of the oxygen partial pressure on the composition and optical properties of electron-beam evaporated TiOx films

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; DEPOSITION; ELECTRON RESONANCE; ELECTRON SCATTERING; EVAPORATION; LIGHT EXTINCTION; OXYGEN; PARTIAL PRESSURE; REFRACTIVE INDEX; SEMICONDUCTING FILMS;

EID: 0036748772     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200209)193:1<69::AID-PSSA69>3.0.CO;2-4     Document Type: Article
Times cited : (3)

References (13)
  • 11
    • 0010938793 scopus 로고
    • in: O. Meyer, G. Linker, and F. Kappeler (Eds.); Plenum Press, New York
    • R.F. Lever, in: O. Meyer, G. Linker, and F. Kappeler (Eds.), Ion Beam Surface Layer Analysis, Vol. 1, Plenum Press, New York 1976 (p. 111).
    • (1976) Ion Beam Surface Layer Analysis , vol.1 , pp. 111
    • Lever, R.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.