Comments on "ill conditioning in self-heating FET models"

IEEE Microwave and Wireless Components Letters

Volumn 12, Issue 9, 2002, Pages 351-352

  Parker, Anthony E ^a  

^a MACQUARIE UNIVERSITY   (Australia)

Author keywords

Circuit simulation; Microwave FETs

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; NONLINEAR NETWORK ANALYSIS; THERMAL EFFECTS; THERMODYNAMIC STABILITY; THRESHOLD VOLTAGE;

SELF-HEATING EFFECTS;

FIELD EFFECT TRANSISTORS;

EID: 0036746009     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2002.803141     Document Type: Article

References (1)

1. A. E. Parker and J. G. Rathmell, "Measurement and characterization of HEMT dynamics," IEEE Trans. Microwave Theory Tech., vol. 49, pp. 2105-2111, Nov. 2001.