Stoichiometry and structural refinement of liquid-phase epitaxial grown LiNb1-xTaxO3 films on LiNbO3 substrates

Journal of Crystal Growth

Volumn 244, Issue 1, 2002, Pages 78-87

  Kaigawa, Kazuyuki ^a   Yamamura, Yoshihiko ^a   Kumazawa, Youichiro ^a   Kawaguchi, Tatsuo ^a   Imaeda, Minoru ^a   Sakai, Hiroaki ^a   Tsurumi, Takaaki ^b  

^a NGK INSULATORS LTD   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

A1. High resolution X ray diffraction; A1. Interface; A3. Liquid phase epitaxy; B1. Lithium compounds; B1. Niobates; B2. Nonlinear optic materials

Indexed keywords

ACTIVATION ENERGY; CHEMICAL ANALYSIS; DIFFUSION; FILM GROWTH; LITHIUM NIOBATE; NONLINEAR OPTICS; OPTICAL MATERIALS; STOICHIOMETRY; SUBSTRATES; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

INTERDIFFUSION LAYERS;

LIQUID PHASE EPITAXY;

EID: 0036723117     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01609-3     Document Type: Article

References (33)