Near K-edge linear attenuation coefficients for Si, SiO2 and Si3N4

Radiation Physics and Chemistry

Volumn 65, Issue 2, 2002, Pages 109-121

  Owens, Alan ^a   Fraser, G W ^b   Gurman, S J ^b  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ATTENUATION; SILICON NITRIDE; SYNCHROTRON RADIATION; X RAY ANALYSIS;

STANDARD ATOMIC DATA TABLES;

SILICA;

CRYSTALLIN; SILICON; SILICON DIOXIDE; SILICON NITRIDE;

ARTICLE; ATOM; CHEMICAL STRUCTURE; INTERMETHOD COMPARISON; LIGHT ABSORPTION; MATERIALS; MEASUREMENT; RADIATION ATTENUATION; STANDARD; SYNCHROTRON RADIATION; X RAY;

EID: 0036709317     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-806X(02)00207-4     Document Type: Article

References (19)

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