New surface morphology for low stress thin-film-coated thermal neutron detectors

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 1999-2004

  McGregor, Douglas S ^a,b   Klann, Raymond T ^c   Gersch, Holly K ^a,d   Ariesanti, Elsa ^a,b   Sanders, Jeffrey D ^a,c   VanDerElzen, Brian ^d  

^a IEEE   (United States)

^b Sunflower Networking Group   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Neutron detector; Semiconductor detector

Indexed keywords

NEUTRON-REACTIVE MATERIALS;

ADHESION; MORPHOLOGY; SEMICONDUCTOR MATERIALS; STRESS ANALYSIS; THIN FILMS;

NEUTRON DETECTORS;

EID: 0036703291     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801697     Document Type: Article

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