Self-biased boron-10 coated high-purity epitaxial gaas thermal neutron detectors

IEEE Transactions on Nuclear Science

Volumn 47, Issue 4 PART 1, 2000, Pages 1364-1370

  McGregor, D S ^a,b   Vernon, S M ^a   Gersch, H K ^a   Markham, S M ^a   Wojtczuk, S J ^a   Wehe, D K ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b SPIRE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; INTERFACES (MATERIALS); SEMICONDUCTING BORON; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE;

NEUTRON REACTIVE FILMS; SCHOTTKY BLOCKING CONTACTS; THERMAL NEUTRON DETECTORS;

NEUTRON DETECTORS;

EID: 0034244890     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.872979     Document Type: Article

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