A very simple method to measure the input capacitance and the input current of transistors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 469, Issue 1, 2001, Pages 116-126

  Fascilla, Andrea ^a   Pessina, Gianluigi ^a  

^a UNIVERSITY OF MILAN   (Italy)

Author keywords

Low Noise; Transistors input characterization; Transistors input current measurement

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRIC CURRENT MEASUREMENT; GATES (TRANSISTOR); READOUT SYSTEMS; SPURIOUS SIGNAL NOISE;

INPUT CURRENT MEASUREMENT;

RADIATION DETECTORS;

EID: 0035421841     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00791-4     Document Type: Article

References (10)