Large surface X-ray pixel detector

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 1709-1711

  Delpierre, P ^a   Berar, J F ^b   Blanquart, L ^c   Boudet, N ^b   Breugnon, P ^a   Caillot, B ^b   Clemens, J C ^a   Mouget, C ^b   Potheau, R ^a   Valin, I ^a  

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Crystallography; Detector; Instrumentation; Pixels; X rays

Indexed keywords

PHOTONS; SURFACE PROPERTIES; X RAY CRYSTALLOGRAPHY; X RAYS;

X-RAY PIXEL DETECTORS;

RADIATION DETECTORS;

EID: 0036703099     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801501     Document Type: Article

References (5)

1. K.H. Becks, P. Borghi, J.M. Brunet, M. Caccia, J.C. Clemens, and M. Cohen-Solal et al., "The DELPHI PIXELS," Nucl. Instrum. Methods, vol. A386, pp. 11-17, 1997.
2. ATLAS Pixel Community, "ATLAS pixel detector technical design report,", CERN/LHCC/98-13, May 31, 1998.
3. P. Delpierre, J.F. Bérar, L. Blanquart, B. Caillot, J.C. Clemens, L. Crest, C. Mouget, R. Potheau, and I. Valin, "X-ray pixel detector for crystallography," IEEE Trans. Nucl. Sci., vol. 48, pp. 987-991, 2001.
4. L. Blanquart, I. Valin, C. Trouilleau, S. Meillere, and L. Crest, "XPAd, a new read-out pixel chip for X-ray counting," in 2000 IEEE NSS-MIC Symp., Lyon, France, Oct. 15-20, 2000.
5. I. Gorelov, G. Gorfine, M. Hoeferlamp, V. Mata-Bruni, G. Santisbevan, and S.C. Seidel et al., "Electrical characteristics of silicon detectors," Nucl. Instrum. Methods, to be published.