Factor analysis applied to the study of valence band resonant photoemission spectra in transition-metal compounds

Surface and Interface Analysis

Volumn 34, Issue 1, 2002, Pages 244-247

  Sanchez Agudo M ^a   Soriano, L ^a   Trigo, J F ^a   Quiros C ^a   Fuentes, G G ^a   Morant, C ^a   Elizalde, E ^a   Sanz, J M ^a  

^a INSTITUTO NICOLÁS CABRERA   (Spain)

Author keywords

Factor analysis; Resonant photoemission spectroscopy; TiO2 thin film

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; ELECTRONIC DENSITY OF STATES; PHOTOEMISSION; PRINCIPAL COMPONENT ANALYSIS; THIN FILMS; X RAY SPECTROSCOPY;

FACTOR ANALYSIS; PHOTON ENERGY; RESONANCE PHENOMENA; VALENCE BAND RESONANT PHOTOEMISSION SPECTRA; X RAY ABSORPTION SPECTRUM;

TITANIUM DIOXIDE;

EID: 0036693817     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1292     Document Type: Conference Paper

References (20)