Determining the angular admittance of a cylindrical mirror analyser

Surface and Interface Analysis

Volumn 34, Issue 1, 2002, Pages 782-785

  Watts, B ^a   Thomsen, L ^a   Dastoor, P C ^a  

^a UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

CMA; Depth profiling; Electron spectrometer; Response function

Indexed keywords

FUNCTION EVALUATION; MIRRORS; PROBABILITY DISTRIBUTIONS; SPECTROSCOPIC ANALYSIS; SURFACES;

ANGULAR ADMITTANCE; CYLINDRICAL MIRROR ANALYZER;

PHOTOELECTRON SPECTROSCOPY;

EID: 0036693529     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1410     Document Type: Conference Paper

References (12)