SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 34, Issue 1, 2002, Pages 677-680

Use of spectroscopic ellipsometry to study Zr/Ti films on Al

(3) Laha, P a Schram, T a Terryn, H a

a VRIJE UNIVERSITEIT BRUSSEL (Belgium)

Author keywords

Aluminium; Conversion coating; Spectroscopic ellipsometry; Zr Ti

Indexed keywords

ALUMINUM; AUGER ELECTRON SPECTROSCOPY; CHARACTERIZATION; ELLIPSOMETRY; MORPHOLOGY; OPTICAL COATINGS; PASSIVATION; SPECTROSCOPIC ANALYSIS; THICKNESS MEASUREMENT; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CONVERSION COATING; SPECTROSCOPIC ELLIPSOMETRY; TITANIUM FLUORIDE; ZIRCONIUM FLUORIDE;

ZIRCONIUM COMPOUNDS;

EID: 0036693426 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1386 Document Type: Conference Paper

Times cited : (47)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.