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Volumn 49, Issue 8, 2002, Pages 1160-1165

"Real time" noise measurements with sensitivity exceeding the standard thermal noise limit

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCIES; HIGH ELECTRON MOBILITY TRANSISTORS; MICROWAVES; REAL TIME SYSTEMS; SIGNAL PROCESSING;

EID: 0036692929     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2002.1026028     Document Type: Article
Times cited : (19)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.