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Volumn 49, Issue 8, 2002, Pages 1160-1165
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"Real time" noise measurements with sensitivity exceeding the standard thermal noise limit
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Author keywords
[No Author keywords available]
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Indexed keywords
FREQUENCIES;
HIGH ELECTRON MOBILITY TRANSISTORS;
MICROWAVES;
REAL TIME SYSTEMS;
SIGNAL PROCESSING;
NOISE MEASUREMENT;
THERMAL NOISE;
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EID: 0036692929
PISSN: 08853010
EISSN: None
Source Type: Journal
DOI: 10.1109/TUFFC.2002.1026028 Document Type: Article |
Times cited : (19)
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References (9)
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