Double correlating interferometer scheme for measuring PM and AM noise

Electronics Letters

Volumn 34, Issue 1, 1998, Pages 93-94

  Rubiola, E ^a   Giordano, V ^b   Groslambert, J ^b  

^a POLITECNICO DI TORINO   (Italy)

^b Lab Phys Metrologie Oscillateurs   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; INTERFEROMETERS;

ACOUSTIC NOISE REJECTION; FOURIER FREQUENCY;

INTERFEROMETRY;

EID: 0032495389     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19980129     Document Type: Article

References (3)

1. SANN, K.H.: 'The measurement of near-carrier noise in microwave amplifiers', IEEE Trans. Microw. Theory Tech., 1968, MTT-16, (9), pp. 761-766
2. IVANOV, E.N., TOBAR, M.E., and WOODE, R.A.: 'A study of noise phenomena in microwave components using an advanced noise measurement system', IEEE Trans. Ultrason. Ferroelectr. Freq. Control., 1997, 44, (1), pp. 161-163
3. WALLS, F.L., FERRE-PIKAL, E.S., and JEFFERTS, S.R.: Origin of 1/f pm and am noise in bipolar junction transistor amplifiers', IEEE Trans. Ultrason. Ferroelectr. Freq. Control, 1997, 44, (2), pp. 326-334