Short-open calibration technique for field theory-based parameter extraction of lumped elements of planar integrated circuits

IEEE Transactions on Microwave Theory and Techniques

Volumn 50, Issue 8, 2002, Pages 1861-1869

  Zhu, Lei ^a,b   Wu, Ke ^a,c  

^a IEEE   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c POLY GRAMES RESEARCH CENTER   (Canada)

Author keywords

Equivalent circuit model; Lumped element; Method of moments; Microstrip step discontinuity; Planar integrated circuits; Short open calibration

Indexed keywords

FIELD THEORY-BASED PARAMETER EXTRACTION; PLANAR INTEGRATED CIRCUITS; SHORT-OPEN CALIBRATION TECHNIQUE;

CALIBRATION; COMPUTER SIMULATION; ELECTRIC NETWORK TOPOLOGY; EQUIVALENT CIRCUITS; METHOD OF MOMENTS; RECTANGULAR WAVEGUIDES; STANDARDS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0036687597     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.801311     Document Type: Article

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