Structure of Lu4Si2O7N2 analyzed by the Rietveld method using the time-of-flight neutron powder diffraction pattern

Journal of the American Ceramic Society

Volumn 85, Issue 8, 2002, Pages 2072-2077

  Takahashi, Junichi ^a,e   Yamane, Hisanori ^a   Shimada, Masahiko ^a,d   Yamamoto, Yoshinobu ^b   Hirosaki, Naoto ^b,d   Mitomo, Mamoru ^b,d   Oikawa, Kenichi ^c   Torii, Shuki ^c,e   Kamiyama, Takashi ^c  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^d AMERICAN CERAMIC SOCIETY   (United States)

^e IBARAKI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; NEUTRON DIFFRACTION; NEUTRON SCATTERING; NUCLEAR MAGNETIC RESONANCE; X RAY DIFFRACTION ANALYSIS;

NEUTRON POWDER DIFFRACTIONS;

LUTETIUM COMPOUNDS;

EID: 0036687248     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2002.tb00406.x     Document Type: Article

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