Scattering-parameter measurements of laser diodes

Optical and Quantum Electronics

Volumn 34, Issue 8, 2002, Pages 747-757

  Zhu, N H ^a   Liu, Y ^a   Pun, E Y B ^b   Chung, P S ^b  

^a INSTITUTE OF SEMICONDUCTORS   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Microwave network analyzer; Scattering parameter measurement; Semiconductor laser diode; Text fixture calibration

Indexed keywords

ELECTRIC IMPEDANCE; FREQUENCY RESPONSE; LIGHT SCATTERING; PARAMETER ESTIMATION; REFLECTION;

BOND WIRE; SCATTERING PARAMETER MEASUREMENT; SHORT OPEN MATCH METHOD;

SEMICONDUCTOR LASERS;

EID: 0036685099     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1016566021645     Document Type: Article

References (8)