Phase uncertainty in calibrating microwave test fixtures

IEEE Transactions on Microwave Theory and Techniques

Volumn 47, Issue 10, 1999, Pages 1917-1922

  Zhu, Ning Hua ^a  

^a INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CALIBRATION; ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING;

MICROWAVE NETWORK ANALYZERS; MICROWAVE TEST FIXTURES; PHASE UNCERTAINTY; THRU-OPEN-MATCH (TOM) TECHNIQUES; THRU-SHORT-MATCH (TSM) TECHNIQUES;

MICROWAVE MEASUREMENT;

EID: 0033353283     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.795064     Document Type: Article

References (13)

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