Electron slowing down in solid targets: Monte-Carlo calculations

EPJ Applied Physics

Volumn 19, Issue 2, 2002, Pages 89-94

  Bouarissa, N ^a   Deghfel, B ^a   Bentabet, A ^a  

^a UNIVERSITY OF M'SILA   (Algeria)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; COMPUTER SIMULATION; COPPER; INTERFACES (MATERIALS); MONTE CARLO METHODS; SCANNING ELECTRON MICROSCOPY; STATISTICAL METHODS; TARGETS;

LOW ENERGY ELECTRON MICROSCOPY (LEEM);

ELECTRON SCATTERING;

EID: 0036682395     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2002053     Document Type: Article

References (26)