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Volumn 17, Issue 8, 2002, Pages 1914-1922

X-ray photoelectron spectroscopy characterization and morphology of MgO thin films grown on single-crystalline diamond (100)

(3) Lee, S M a Ito, T a Murakami, H a

a OSAKA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; DIAMONDS; ETCHING; EVAPORATION; INTERFACIAL ENERGY; MAGNESIA; MORPHOLOGY; SINGLE CRYSTALS; STOICHIOMETRY; TEMPERATURE; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON BEAM EVAPORATION; MAGNESIUM PEROXIDE;

THIN FILMS;

EID: 0036671146 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2002.0284 Document Type: Article

Times cited : (13)

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