SCOPUS 정보 검색 플랫폼

Advanced Engineering Materials

Volumn 4, Issue 8, 2002, Pages 554-557

X-ray diffraction study of thin film elastic properties

(4) Villain, P a Goudeau, P a Renault, P O a Badawi, K F a

a UNIVERSITÉ DE POITIERS (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; ELASTIC MODULI; ELASTICITY; MULTILAYERS; NANOSTRUCTURED MATERIALS; POISSON RATIO; RESIDUAL STRESSES; SPUTTER DEPOSITION; STRESS ANALYSIS; SUBSTRATES; TENSILE TESTING; X RAY DIFFRACTION ANALYSIS;

HIGH-ANGLE SYMMETRIC X-RAY DIFFRACTION (SXRD);

THIN FILMS;

EID: 0036669918 PISSN: 14381656 EISSN: None Source Type: Journal
DOI: 10.1002/1527-2648(20020806)4:8<554::AID-ADEM554>3.0.CO;2-A Document Type: Conference Paper

Times cited : (1)

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- Villain, P.¹ Renault, P.-O.² Goudeau, Ph.³ Badawi, K.F.⁴

8
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.