Visual inspection of machined metallic high-precision surfaces

Eurasip Journal on Applied Signal Processing

Volumn 2002, Issue 7, 2002, Pages 667-678

  Pernkopf, Franz ^a   O'Leary, Paul ^a  

^a UNIVERSITY OF LEOBEN   (Austria)

Author keywords

Feature selection; Flaw detection; Segmentation; Statistical classification; Surface reflection; Visual inspection

Indexed keywords

ADAPTIVE ALGORITHMS; DEFECTS; FEATURE EXTRACTION; IMAGE SEGMENTATION; MATHEMATICAL MODELS; REAL TIME SYSTEMS; REFLECTION; ROLLER BEARINGS; SURFACES;

FEATURE SELECTION; FLAW DETECTION; STATISTICAL CLASSIFICATION; SURFACE INSPECTION; SURFACE REFLECTION; VISUAL INSPECTION;

IMAGE ANALYSIS;

EID: 0036665729     PISSN: 11108657     EISSN: None     Source Type: Journal    
DOI: 10.1155/S1110865702203145     Document Type: Article

References (25)

1. B. Smith, "Making war on defects: six-sigma design," IEEE Spectrum, vol. 30, no. 9, pp. 43-47, 1993.
2. T. S. Newman and A. K. Jain, "A survey of automated visual inspection," Computer Vision and Image Understanding, vol. 61, no. 2, pp. 231-262, 1995.
3. F. Dupont, C. Odet, and M. Carton, "Optimization of the recognition of defects in flat steel products with the cost matrices theory," NDT and E International, vol. 30, no. 1, pp. 3-10, 1997.
4. S. A. Stefani, C. R. Nagarajah, and R. Willgross, "A surface inspection technique for continuously extruded cylindrical products," Measurement Science and Technology, vol. 10, no. 2, pp. N21-N25, 1999.
5. P. Beckmann and A. Spizzochino, The Scattering of Electromagnetic Waves from Rough Surfaces, Pergamon, New York, NY, USA, 1963.
6. K. E. Torrance and E. M. Sparrow, "Theory for off-specular reflection from roughened surfaces," Journal of the Optical Society of America, vol. 57, no. 9, pp. 1105-1114, 1967.
7. S. K. Nayar, K. Ikeuchi, and T. Kanade, "Surface reflection: Physical and geometrical perspectives," IEEE Trans. on Pattern Analysis and Machine Intelligence, vol. 13, no. 7, pp. 611-634, 1991.
8. P. Kierkegaard, Estimating circular shape of machined parts by computer vision, Ph.D. thesis, University of Linköping, Linköping, Sweden, 1995.
9. R. C. Gonzalez and R. E. Woods, Digital Image Processing, Addison-Wesley, Reading, Mass, USA, 1992.
10. D.-M. Tsai, "A fast thresholding selection procedure for multimodal and unimodal histograms," Pattern Recognition Letters, vol. 16, no. 1, pp. 653-666, 1995.
11. M. Sonka, V. Hlavac, and R. Boyle, Image Processing, Analysis, and Machine Vision, International Thomson Publishing, London, UK, 2nd edition, 1999.
12. F. Pernkopf, Automatic visual inspection of metallic surfaces, Ph.D. thesis, University of Leoben, Leoben, Austria, 2002.
13. M. Dash and H. Liu, "Feature selection for classification," Intelligent Data Analysis, vol. 1, no. 3, pp. 131-156, 1997.
14. P. A. Devijver and J. Kittler, Pattern Recognition: A Statistical Approach, Prentice-Hall, Englewood Cliffs, NJ, USA, 1982.
15. A. K. Jain and D. Zongker, "Feature selection: Evaluation, application, and small sample performance," IEEE Trans. on Pattern Analysis and Machine Intelligence, vol. 19, no. 2, pp. 153-158, 1997.
16. P. Somol, P. Pudil, J. Novovičová, and P. Paclík, "Adaptive floating search methods in feature selection," Pattern Recognition Letters, vol. 20, no. 11-13, pp. 1157-1163, 1999.
17. P. Pudil, J. Novovičová, and J. Kittler, "Floating search methods in feature selection," Pattern Recognition Letters, vol. 15, no. 11, pp. 1119-1125, 1994.
18. J. Kittler, "Feature set search algorithms," in Pattern Recognition and Signal Processing, C. H. Chen, Ed., pp. 41-60, 1978.
19. F. J. Ferri, P. Pudil, M. Hatef, and J. Kittler, "Comparative study of techniques for large-scale feature selection," in Pattern Recognition in Practice IV, E. S. Gelsema and L. N. Kanal, Eds., pp. 403-413, 1994.
20. R. Kohavi, "A study of cross-validation and bootstrap for accuracy estimation and model selection," in Proc. of the 14th International Joint Conference on Artificial Intelligence, pp. 1137-1143, Montreal, Canada, 1995.
21. S. J. Raudys and A. K. Jain, "Small sample size effects in statistical pattern recognition: Recommendations for practitioners," IEEE Trans. on Pattern Analysis and Machine Intelligence, vol. 13, no. 3, pp. 252-264, 1991.
22. L. Kaufman and P. J. Rousseeuw, Finding Groups in Data: An Introduction to Cluster Analysis, John Wiley and Sons, New York, NY, USA, 1990.
23. R. O. Duda and P. E. Hart, Pattern Classification and Scene Analysis, Wiley-Interscience Publications, New York, NY, USA, 1973.
24. K. Fukunaga, Introduction to Statistical Pattern Recognition, Academic Press, New York, NY, USA, 1990.
25. J. Kittler, "Statistical classification," Vistas in Astronomy, vol. 41, no. 3, pp. 405-410, 1997.