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Volumn 20, Issue 4, 2002, Pages 1341-1346
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Method for seed and underlayer optimization of perpendicular magnetic recording media
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COERCIVE FORCE;
COMPOSITION EFFECTS;
GRAIN SIZE AND SHAPE;
KERR MAGNETOOPTICAL EFFECT;
MAGNETRON SPUTTERING;
OPTIMIZATION;
SCANNING ELECTRON MICROSCOPY;
SURFACE ROUGHNESS;
THICKNESS MEASUREMENT;
TRANSMISSION ELECTRON MICROSCOPY;
ULTRAHIGH VACUUM;
COMPOSITION GRADIENTS;
PERPENDICULAR MAGNETIC RECORDING MEDIA;
MAGNETIC RECORDING;
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EID: 0036648890
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1482709 Document Type: Article |
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Times cited : (4)
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References (9)
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