RF-bias effect on structural and magnetic properties in CoCrPt/Cr75Ti25/CoTi trilayer type longitudinal recording media

IEEE Transactions on Magnetics

Volumn 35, Issue 5 PART 1, 1999, Pages 2664-2666

  Hong, S Y ^a   Shin, K H ^b   Lee, T D ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Cocrpt; Cr75ti25 coti underlayer; Crystallographic texture; Substrate bias

Indexed keywords

COBALT ALLOYS; CRYSTAL MICROSTRUCTURE; CRYSTALLOGRAPHY; MAGNETIC RECORDING; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC TEXTURE; SUBSTRATE BIAS;

MAGNETIC THIN FILMS;

EID: 0033184476     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800939     Document Type: Article

References (4)

1. D. J. Rogers, J. N. Chapman, J. P. C. Bernards, and S. B. Luitjens, Determination of local composition in Co-Cr films deposited at different substrate temperatures, IEEE Trans. Magn., vol. 25, no. 5, p. 4180, 1989.
2. Y. Deng, D. N. Lambeth, X. Sui, L. L. Lee, and D. E. Laughlin, Substrate Bias Effects on Composition and Coercivity of CoCrTa/Cr Thin Films on Canasite and Glass, J. Appl. Phys., vol. 73, p. 5557, 1993.
3. 25/CoTi bilayer, J. Appl. Phys., vol. 85, no. 8, pp. 4298-4300, 1999.
4. P. Glijer, J. M. Sivertsen, and J. H. Judy, Effects of platinum content and substrate bias an the structure and magnetic properties of CoCrPt/Cr thin films, J. Appl. Phys., vol. 73, p. 5563, 1993.